Minority carrier lifetime control in pow
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Zhang Bin; Chen Yongqi; Wang Peiqing; Wang Dongguang
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Article
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1993
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Elsevier Science
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English
β 329 KB
A new technology for controlling reduction of minority carrier lifetime of power semiconductor devices was given in this paper, using fast neutron irradiation in nuclear reactor. The effects of high frequency thyristor by fast neutron irradiation is mainly discussed. Furthermore, a comparison is ma