✦ LIBER ✦

4564807 Method of judging carrier lifetime in semiconductor devices

✍ Scribed by Hiroyuk Ikezi; RichardL Freeman

Publisher: Elsevier Science
Year: 1986
Tongue: English
Weight: 171 KB
Volume: 26
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(86)90246-5

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