The processing of semiconductor devices within a high vacuum or controlled ambient environment has received much attention over the past few years. The motivations for in situ processing include avoidance of contamination or oxidation in the atmosphere, improved device yields, and process simplifica
Contactless electromodulation for in situ characterization of semiconductor processing
β Scribed by X. Yin; X. Guo; F.H. Pollak; G.D. Pettit; D.T. McInturff; J.M. Woodall; Eun-Hee Cirlin
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 246 KB
- Volume
- 63
- Category
- Article
- ISSN
- 0169-4332
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