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Contact resistance in organic thin film transistors

✍ Scribed by Andraž Petrović; E. Pavlica; Gvido Bratina; Alessandro Carpentiero; Massimo Tormen


Book ID
116898617
Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
594 KB
Volume
159
Category
Article
ISSN
0379-6779

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We report a study on the contact resistance instability induced by the bias stress in staggered pentacene thin film transistors, combining the bias stress measurements with the transfer line method. The contact resistance is increasing with the stress time, and two device parameters are found to con