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Simultaneous extraction of source and drain resistances in top contact organic thin film transistors from a single test structure

✍ Scribed by Ashish K. Agarwal; Baquer Mazhari


Book ID
119340094
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
791 KB
Volume
13
Category
Article
ISSN
1566-1199

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