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Conducting atomic force microscopy for nanoscale tunnel barrier characterization

✍ Scribed by Lang, K. M.; Hite, D. A.; Simmonds, R. W.; McDermott, R.; Pappas, D. P.; Martinis, John M.

Book ID: 120252270
Publisher: American Institute of Physics
Year: 2004
Tongue: English
Weight: 696 KB
Volume: 75
Category: Article
ISSN: 0034-6748
DOI: 10.1063/1.1777388

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