✦ LIBER ✦

Conducting Probe Atomic Force Microscopy: A Characterization Tool for Molecular Electronics

✍ Scribed by Tommie W. Kelley; Eric Granstrom; C. Daniel Frisbie

Publisher: John Wiley and Sons
Year: 1999
Tongue: English
Weight: 243 KB
Volume: 11
Category: Article
ISSN: 0935-9648
DOI: 10.1002/(sici)1521-4095(199903)11:3<261::aid-adma261>3.0.co;2-b

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Atomic force microscopy—a powerful tool

Atomic force microscopy—a powerful tool for industrial applications

✍ Karbach, A.; Drechsler, D. 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 997 KB

The phenomenal success of atomic force microscopy (AFM) in industry is based on the easy access of samples with practical interest due to the high resolution and high contrast of the method under controllable ambient conditions. In our case, the high resolution of AFM is mainly used in the mesoscale

DNA Chip at a Molecular Scale : Atomic F

DNA Chip at a Molecular Scale : Atomic Force Microscopy for Bio-sensors Studies

✍ Magali Phaner-Goutorbe 📂 Article 📅 2007 🏛 Wiley (John Wiley & Sons) ⚖ 648 KB

Atomic Force Microscopy becomes an invaluable technique for the study of biological systems at a nanometric scale [1, 2]. During the past decade, it has been increasingly used to image and manipulate biomolecules and cell surfaces in air or in situ. Development of dynamic modes of operation adapted

Microdroplet and Atomic Force Microscopy

Microdroplet and Atomic Force Microscopy Probe Assisted Formation of Acidic Thin Layers for Silicon Nanostructuring

✍ X. N. Xie; H. J. Chung; C. H. Sow; A. T. S. Wee 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 321 KB 👁 2 views

## Abstract In this work, an aqueous acidic thin‐layer‐based strategy for fabricating nanostructures on silicon by using atomic force microscopy (AFM) nanolithography is presented. The approach involves the formation of microscale droplets via dilute hydrofluoride (DHF) etching, the conversion of t

A vision-based, 3D reconstruction techni

A vision-based, 3D reconstruction technique for scanning electron microscopy: Direct comparison with atomic force microscopy

✍ Mario Raspanti; Elisabetta Binaghi; Ignazio Gallo; Alessandro Manelli 📂 Article 📅 2005 🏛 John Wiley and Sons 🌐 English ⚖ 993 KB

Atomic force microscopy characterization

Atomic force microscopy characterization of ultrafiltration membranes: correspondence between surface pore dimensions and molecular weight cut-off

✍ W. Richard Bowen; Teodora A. Doneva 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 141 KB 👁 2 views

Automated Scanning Probe Microscopy as a

Automated Scanning Probe Microscopy as a New Tool for Combinatorial Polymer Research: Conductive Carbon Black/Poly(dimethylsiloxane) Composites

✍ Riadh Neffati; Alexander Alexeev; Sergey Saunin; José C. M. Brokken-Zijp; Daan W 📂 Article 📅 2003 🏛 John Wiley and Sons 🌐 English ⚖ 233 KB

## Abstract A systematic investigation into the surface properties of siloxane rubber/carbon black (CB) nanocomposites has been performed, using an automated scanning probe microscope. In this way the influence of CB concentration and curing rate of the siloxane rubber matrix on roughness and condu