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A vision-based, 3D reconstruction technique for scanning electron microscopy: Direct comparison with atomic force microscopy

✍ Scribed by Mario Raspanti; Elisabetta Binaghi; Ignazio Gallo; Alessandro Manelli


Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
993 KB
Volume
67
Category
Article
ISSN
1059-910X

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