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Characterization of tips for conducting atomic force microscopy in ultrahigh vacuum

✍ Scribed by M. A. Lantz; S. J. O’shea; M. E. Welland

Book ID: 121653330
Publisher: American Institute of Physics
Year: 1998
Tongue: English
Weight: 576 KB
Volume: 69
Category: Article
ISSN: 0034-6748
DOI: 10.1063/1.1148838

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