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Conducting atomic-force-microscope electrical characterization of submicron magnetic tunnel junctions

✍ Scribed by Worledge, D. C.; Abraham, David W.

Book ID: 120202902
Publisher: American Institute of Physics
Year: 2003
Tongue: English
Weight: 266 KB
Volume: 82
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1582375

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