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Concentration profiles of hydrogen in technical oxidic thin films and multilayer systems

✍ Scribed by W. Wagner; F. Rauch; K. Bange

Book ID
112376608
Publisher
Springer
Year
1989
Tongue
English
Weight
293 KB
Volume
333
Category
Article
ISSN
1618-2650

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πŸ“œ SIMILAR VOLUMES

In-depth profiling of hydrogen in oxidic
In-depth profiling of hydrogen in oxidic multilayer systems
✍ W. Wagner; F. Rauch; C. Ottermann; K. Bange πŸ“‚ Article πŸ“… 1990 πŸ› John Wiley and Sons 🌐 English βš– 332 KB

## Abstract The hydrogen concentration profiles of electrochromic multilayer systems produced by evaporation have been determined by means of nuclear reaction analysis. The H content of individual oxidic materials was found to be larger than for single films, especially for SiO~2~. The time‐depende