Defect profiling in elemental and multilayer systems: correlations of fitted defect concentrations with positron implantation profiles

✍ Scribed by V.J. Ghosh; B. Nielsen; K.G. Lynn; D.O. Welch

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 427 KB
• Volume: 85
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(94)00333-5