๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Concentration profiles during films deposition from a low-energy ion beam

โœ Scribed by V. I. Kiprich; G. V. Kornich; A. I. Bazhin


Book ID
106524538
Publisher
Springer
Year
2007
Tongue
English
Weight
326 KB
Volume
50
Category
Article
ISSN
1573-9228

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


3108. Thin-film deposition using low-ene
๐Ÿ“‚ Article ๐Ÿ“… 1977 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 133 KB

of Ti to a few percent. Pre-evaporation of a 300 ,~ thick CaF.~ parting layer allowed membrane removal by water-assisted peeling. Pressure testing showed membranes to have bulk tensile strength of 4.6-6.2,'< l09 dyn/cm 2 (68-92 kpsi) and to behave elastically. They could be mounted under high tensio

3109. Thin-film deposition using low-ene
๐Ÿ“‚ Article ๐Ÿ“… 1977 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 133 KB

of Ti to a few percent. Pre-evaporation of a 300 ,~ thick CaF.~ parting layer allowed membrane removal by water-assisted peeling. Pressure testing showed membranes to have bulk tensile strength of 4.6-6.2,'< l09 dyn/cm 2 (68-92 kpsi) and to behave elastically. They could be mounted under high tensio