Concentration profiles during films deposition from a low-energy ion beam
โ Scribed by V. I. Kiprich; G. V. Kornich; A. I. Bazhin
- Book ID
- 106524538
- Publisher
- Springer
- Year
- 2007
- Tongue
- English
- Weight
- 326 KB
- Volume
- 50
- Category
- Article
- ISSN
- 1573-9228
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of Ti to a few percent. Pre-evaporation of a 300 ,~ thick CaF.~ parting layer allowed membrane removal by water-assisted peeling. Pressure testing showed membranes to have bulk tensile strength of 4.6-6.2,'< l09 dyn/cm 2 (68-92 kpsi) and to behave elastically. They could be mounted under high tensio
of Ti to a few percent. Pre-evaporation of a 300 ,~ thick CaF.~ parting layer allowed membrane removal by water-assisted peeling. Pressure testing showed membranes to have bulk tensile strength of 4.6-6.2,'< l09 dyn/cm 2 (68-92 kpsi) and to behave elastically. They could be mounted under high tensio