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Concentration-dependent diffusion in amorphous Fe-B films studied by Auger electron depth profiling

✍ Scribed by F. Stobiecki; W. Pamler; W. Reill; K. Röll; H. Hoffmann

Book ID
119443781
Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
701 KB
Volume
88
Category
Article
ISSN
0022-3093

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✍ S. Matsuzawa; N. Baba; S. Tajima 📂 Article 📅 1979 🏛 Elsevier Science 🌐 English ⚖ 286 KB

In-depth composition profiles of the an&c oxide films grown on Al (1 I1 ), (I 10) and (100) single crystal electrodes in ammonium borate were studied by Auger electron spectroscopy with Ar ion etching. The oxide film had the composition of Ai,O, as referenced to an authentic a-Al,O, single crystal.