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Auger-electron-depth profiling studies on surface layers grown by annealing Fe-Si-Al alloys in oxidizing atmospheres

✍ Scribed by Hartig, K.; Pospiech, G.


Book ID
125430435
Publisher
Elsevier Science
Year
1980
Tongue
English
Weight
293 KB
Volume
19
Category
Article
ISSN
0304-8853

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