Computer Simulation of Electron Microscope Images

✍ Scribed by D. M. Maher; R. C. Perrin; R. Bullough

• Publisher: John Wiley and Sons
• Year: 1971
• Tongue: English
• Weight: 577 KB
• Volume: 43
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/pssb.2220430231

✦ Synopsis

Abstract

A procedure has been developed which enables computer‐simulated electron micrographs of defects in crystalline foils to be constructed that are, photographically speaking, virtually indistinguishable from the corresponding experimental micrographs. The intensity variations in the image are simulated by constructing a suitable matrix of overprinted “dots” on the output of a Stromberg‐Carlson 4060 plotting device. These variations are quantitatively calibrated in the final micrograph against the corresponding optical densities. The number of grey levels generated by a given set of computer and photographic variables is sufficiently large to provide excellent tonal separation in the final simulated image and high resolution micrographs are readily achieved.