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Electron microscope images of coincidence boundaries

✍ Scribed by Sutton, A. P. ;Pond, R. C.

Publisher
John Wiley and Sons
Year
1978
Tongue
English
Weight
519 KB
Volume
45
Category
Article
ISSN
0031-8965

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## Abstract A procedure has been developed which enables computer‐simulated electron micrographs of defects in crystalline foils to be constructed that are, photographically speaking, virtually indistinguishable from the corresponding experimental micrographs. The intensity variations in the image