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A method for simulating electron microscope dislocation images

✍ Scribed by R. Schäublin; P. Stadelmann

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 622 KB
Volume: 164
Category: Article
ISSN: 0921-5093
DOI: 10.1016/0921-5093(93)90696-c

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