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An analysis of the symmetries in electron microscope images of a sloping dislocation and its application as a method for dislocation characterization

✍ Scribed by Ingram, J. C. ;Strutt, P. R. ;Tzeng, Wen-Shian


Publisher
John Wiley and Sons
Year
1974
Tongue
English
Weight
638 KB
Volume
22
Category
Article
ISSN
0031-8965

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