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Comparison of ionizing radiation effects in 0.18 and 0.25 μm cmos technologies for analog applications

✍ Scribed by Manghisoni, M.; Ratti, L.; Re, V.; Speziali, V.; Traversi, G.; Candelori, A.

Book ID: 118142022
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 405 KB
Volume: 50
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.2003.820767

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