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Ionizing radiation effects on a 64-channel charge measurement ASIC designed in CMOS 0.35 μm technology

✍ Scribed by A. La Rosa; F. Marchetto; J. Pardo; M. Donetti; A. Attili; F. Bourhaleb; R. Cirio; M.A. Garella; S. Giordanengo; N. Givehchi; S. Iliescu; G. Mazza; A. Pecka; C. Peroni; G. Pittà

Book ID: 108223506
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 532 KB
Volume: 593
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2008.05.037

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