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Radiation hardness perspectives for the design of analog detector readout circuits in the 0.18-μm CMOS generation

✍ Scribed by Manghisoni, M.; Ratti, L.; Re, V.; Speziali, V.

Book ID: 120000345
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 423 KB
Volume: 49
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2002.805413

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