๐”– Bobbio Scriptorium
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Comparison of focused ion beam and laser techniques for optical mask repair

โœ Scribed by P.J. Heard; P.D. Prewett; R.A. Lawes


Book ID
107920357
Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
379 KB
Volume
6
Category
Article
ISSN
0167-9317

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A new focused ion beam optical system that uses a liquid metal ion source was designed for a new secondary ion time-of-flight mass spectrometry instrument. This optical system consists mainly of two electrostatic lenses. The axial performance of the system was calculated to decide the design values