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Comparison of Dopant Concentrations Determined by Photoluminescence and Hall Effect in Si:B, P

โœ Scribed by Dipl.-Phys G. Schramm; Dr. sc. nat. R. Herzog; Dipl-Ing. E. Zuber


Publisher
John Wiley and Sons
Year
1991
Tongue
English
Weight
141 KB
Volume
26
Category
Article
ISSN
0232-1300

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๐Ÿ“œ SIMILAR VOLUMES


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โœ G. Schramm; R. Herzog; H. Kessler ๐Ÿ“‚ Article ๐Ÿ“… 1991 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 427 KB

Calibration curves to determine P, B, and A1 concentrations in silicon at 4.2 K from the intensity ratios of bound (BE) and free (FE) exciton related luminescence are presented. The integral relative intensities of the peaks are used besides the peak height ratios. By means of a large number of samp

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Calibration curves to determine the concentrations of shallow impurities in Si were usually established with the help of homogeneous doped samples at 4.2 K. The improvement of the lateral resolution power necessary to characterize inhomogeneous samples can be conveniently achieved by the use of supe