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Comparative TEM study of bonded silicon/silicon interfaces fabricated by hydrophilic, hydrophobic and UHV wafer bonding

✍ Scribed by A. Reznicek; R. Scholz; S. Senz; U. Gösele


Book ID
114193481
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
645 KB
Volume
81
Category
Article
ISSN
0254-0584

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