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Structural evaluation of silicon-on-insulator fabricated by a direct wafer bonding and numerically controlled polishing technique: A. Yamada, B. Jiang, G. A. Rozgonyi, H. Shirotori, O. Okabayashi, M. Kawashima, Journal of the Electrochemical Society, 138(8), pp. 2468–2474. (Aug 1991)


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
138 KB
Volume
14
Category
Article
ISSN
0141-6359

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