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Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits

โœ Scribed by Martin Keim; Nicole Drechsler; Rolf Drechsler; Bernd Becker


Book ID
110298353
Publisher
Springer US
Year
2001
Tongue
English
Weight
180 KB
Volume
17
Category
Article
ISSN
0923-8174

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