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Combined EPMA and AES depth profiling of a multilayer Ti-Al-O-N coating

✍ Scribed by Alexander von Richthofen; Michitaka Matsuo; Peter Karduck; Norbert Ammann


Book ID
105132775
Publisher
Springer
Year
1994
Tongue
English
Weight
682 KB
Volume
114-115
Category
Article
ISSN
0026-3672

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