𝔖 Bobbio Scriptorium

✦ LIBER ✦

Combined atomic force microscopy and spectroscopic ellipsometry applied to the analysis of lipid–protein thin films

✍ Scribed by Finot, Eric; Markey, Laurent; Hane, Francis; Amrein, Mathias; Leonenko, Zoya

Book ID: 120488287
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 602 KB
Volume: 104
Category: Article
ISSN: 0927-7765
DOI: 10.1016/j.colsurfb.2012.12.013

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Complete characterization of rough polym

Complete characterization of rough polymorphous silicon films by atomic force microscopy and the combined method of spectroscopic ellipsometry and spectroscopic reflectometry

✍ Daniel Franta; Ivan Ohlı́dal; Petr Klapetek; Pere Roca i Cabarrocas 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 122 KB

Study of the surfaces of CVD-WO3films, b

Study of the surfaces of CVD-WO3films, by atomic force microscopy and spectroscopic ellipsometry

✍ R. E. Tanner; A. Szekeres; D. Gogova; K. Gesheva 📂 Article 📅 2003 🏛 Springer US 🌐 English ⚖ 257 KB

Study of resonant tunneling in Au nanocl

Study of resonant tunneling in Au nanoclusters on the surface of SiO2/Si thin films using the combined scanning tunneling microscopy and atomic-force microscopy technique

✍ M. A. Lapshina; D. O. Filatov; D. A. Antonov; N. S. Barantsev 📂 Article 📅 2009 🏛 Pleiades Publishing 🌐 English ⚖ 281 KB

Comparison of Two Methods of Methyl Grou

Comparison of Two Methods of Methyl Group Grafting to the Silica Thin Film Surface and Its Tribological Properties Measured by Atomic Force Microscopy

✍ J.P. Grobelny; G. Celichowski; M. Cichomski; A.J. Kulik; I.J. Piwoński; S. Plaza 📂 Article 📅 2004 🏛 Springer US 🌐 English ⚖ 147 KB

Oxygen interaction of CdS-based gas sens

Oxygen interaction of CdS-based gas sensors with different stoichiometric compositions was studied by X-ray photoelectron spectroscopy (XPS) and thermal-desorption mass spectroscopy observations combined with conductivity measurements. Three different types of film with different atomic ratios of Cd/S were used in the study of oxygen chemisorption in a low-temperature range between 300 and 570 K. Spray pyrolysis was used for the deposition of the films on glass substrates; XPS and energy dispersive spectroscopy of X-ray together with atomic force microscopy and scanning electron microscopy were used for the characterization of the composition and structure of the films. It was possible to distinguish different temperature ranges for the thermal desorption of the different adsorbed oxygen species. A comparison of the data from XPS and mass-spectroscopy observations with conductance measurements allows to conclude that metallic surface atoms are responsible for different interactions of oxygen species with CdS surfaces.

📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 379 KB