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Coefficients of thermal expansion of thin metal films investigated by non-ambient X-ray diffraction stress analysis

✍ Scribed by Y. Kuru; M. Wohlschlögel; U. Welzel; E.J. Mittemeijer

Book ID: 108278373
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 260 KB
Volume: 202
Category: Article
ISSN: 0257-8972
DOI: 10.1016/j.surfcoat.2007.08.002

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