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Investigation of coefficient of thermal expansion of silver thin film on different substrates using X-ray diffraction

✍ Scribed by Yeongseok Zoo; Daniel Adams; J.W. Mayer; T.L. Alford


Book ID
108289342
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
202 KB
Volume
513
Category
Article
ISSN
0040-6090

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