Qualitative X-ray diffraction analysis of residual stresses in NdNiO3thin films with metal-insulator transition

X-ray diffraction measurement of residua

X-ray diffraction measurement of residual stress in epitaxial ZnO/α-Al2O3 thin film

✍ Farid Takali; Anouar Njeh; Hartmut Fuess; Mohamed Hédi Ben Ghozlen 📂 Article 📅 2011 🏛 Elsevier Science 🌐 English ⚖ 463 KB

Piezoelectric thin films on high acoustic velocity non piezoelectric substrates, such as ZnO and AlN, deposited on diamond or sapphire substrates, are attractive for high frequency and low-loss surface acoustic wave devices. In this work, ZnO films were epitaxialy grown on R-Al 2 O 3 and C-Al 2 O 3