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Rietveld Texture and Stress Analysis of Thin Films by X-Ray Diffraction

✍ Scribed by Lutterotti, Luca; Matthies, Siegfried; Chateigner, Daniel; Ferrari, Sandro; Ricote, Jesús

Book ID: 120580724
Publisher: Trans Tech Publications, Ltd.
Year: 2002
Tongue: English
Weight: 502 KB
Volume: 408-412
Category: Article
ISSN: 1662-9752
DOI: 10.4028/www.scientific.net/MSF.408-412.1603

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