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Charge loss in WSi2 nanocrystals nonvolatile memory with SiO2/Si3N4/SiO2 tunnel layer

✍ Scribed by Dong Uk Lee; Hyo Jun Lee; Eun Kyu Kim; Hee-Wook You; Won-Ju Cho


Book ID
113513966
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
677 KB
Volume
11
Category
Article
ISSN
1567-1739

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