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Charge Instability in MIS Structures on Silicon with PECVD Boron Nitride Thin Films

✍ Scribed by Korshunov, A. N. ;Kosinova, M. L. ;Salman, E. G. ;Rumyantsev, Yu. M. ;Fainer, N. I. ;Sysoeva, N. P. ;Akkerman, Z. L.

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