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An investigation of carrier transport in thin silicon-on-sapphire films using MIS deep depletion Hall effect structures : A. B. M. Elliot and J. C. Anderson. Solid State Electron. 15 (1972), p. 531


Publisher
Elsevier Science
Year
1972
Tongue
English
Weight
113 KB
Volume
11
Category
Article
ISSN
0026-2714

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