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Charge fluctuations at the bonding interface in the silicon-on-insulator structures

✍ Scribed by I. V. Antonova; V. A. Stuchinskii; O. V. Naumova; D. V. Nikolaev; V. P. Popov

Book ID: 110137068
Publisher: Springer
Year: 2003
Tongue: English
Weight: 69 KB
Volume: 37
Category: Article
ISSN: 1063-7826
DOI: 10.1134/1.1626213

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