Potential fluctuations due to the randomly distributed charges at the semiconductor-insulator interface in MIS-structures

✍ Scribed by G. Slavcheva; I. Yanchev

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 252 KB
• Volume: 79
• Category: Article
• ISSN: 0038-1098
• DOI: 10.1016/0038-1098(91)90501-l