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Characterization of thin-film amorphous semiconductors using spectroscopic ellipsometry

✍ Scribed by G.E. Jellison Jr.; V.I. Merkulov; A.A. Puretzky; D.B. Geohegan; G. Eres; D.H. Lowndes; J.B. Caughman

No coin nor oath required. For personal study only.

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