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Characterization of the Surface Layer on a Strained Si Wafer by Electrochemical Methods

✍ Scribed by Sakata, K.; Kato, M.; Kubo, N.; Senda, T.; Izunome, K.; Homma, T.

Book ID: 126087194
Publisher: American Chemical Society
Year: 2008
Tongue: English
Weight: 202 KB
Volume: 112
Category: Article
ISSN: 1932-7447
DOI: 10.1021/jp710330g

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