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Characterization of the metal-SiO2-Si interface roughness by electrical methods

✍ Scribed by J. Suñé; Y. Placencia; F. Campabadal; X. Aymerich

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of the metal-SiO2-Si in

✍ J. Suñé; Y. Placencia; F. Campabadal; X. Aymerich 📂 Article 📅 1987 🏛 Elsevier Science ⚖ 48 KB

Electrical characterization of the boron

✍ Ghannam, M.Y.; Mertens, R.P.; De Keersmaecker, R.F.; Van Overstraeten, R.J. 📂 Article 📅 1985 🏛 IEEE 🌐 English ⚖ 698 KB

Determination of the SiO_2/Si interface

✍ Roos, A. ;Bergkvist, M. ;Ribbing, C. G. 📂 Article 📅 1988 🏛 The Optical Society 🌐 English ⚖ 509 KB

Determination of the SiO_2/Si interface

✍ Roos, A. ;Bergkvist, M. ;Ribbing, C. G. 📂 Article 📅 1988 🏛 The Optical Society 🌐 English ⚖ 534 KB

Ellipsometric study of Si surface roughn

✍ A Aizenberg; AV Andrianov; SV Nosenko; VI Pshenicin; IA Hromcovski 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 125 KB

Correction to "Electrical characterizati

✍ Ghannam, M.Y. 📂 Article 📅 1985 🏛 IEEE 🌐 English ⚖ 30 KB