✦ LIBER ✦

Determination of the SiO_2/Si interface roughness by diffuse reflectance measurements

✍ Scribed by Roos, A. ;Bergkvist, M. ;Ribbing, C. G.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Determination of the SiO_2/Si interface

✍ Roos, A. ;Bergkvist, M. ;Ribbing, C. G. 📂 Article 📅 1988 🏛 The Optical Society 🌐 English ⚖ 534 KB

Determination of Si/SiO/sub 2/ interface

✍ Anderson, W.R.; Lombardi, D.R.; Wheeler, R.G.; Ma, T.-P. 📂 Article 📅 1993 🏛 IEEE 🌐 English ⚖ 314 KB

Characterization of the metal-SiO2-Si in

✍ J. Suñé; Y. Placencia; F. Campabadal; X. Aymerich 📂 Article 📅 1987 🏛 Elsevier Science ⚖ 48 KB

Ellipsometric study of Si surface roughn

✍ A Aizenberg; AV Andrianov; SV Nosenko; VI Pshenicin; IA Hromcovski 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 125 KB

Statistical properties of atomic-scale S

✍ M. Niwa; H. Iwasaki; Y. Watanabe; I. Sumita; N. Akutsu; Y. Akutsu 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 793 KB

Study of SiO2Si interfaces by photocurr

✍ M.L. Polignano; G. Ferroni; A. Sabbadini; G. Valentini; G. Queirolo 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 498 KB