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Electrical characterization of the boron-doped Si-SiO2interface

✍ Scribed by Ghannam, M.Y.; Mertens, R.P.; De Keersmaecker, R.F.; Van Overstraeten, R.J.


Book ID
114595201
Publisher
IEEE
Year
1985
Tongue
English
Weight
698 KB
Volume
32
Category
Article
ISSN
0018-9383

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