𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Characterization of sputtered nickel/carbon multilayers with soft-x-ray reflectivity measurements

✍ Scribed by Friedrich, J. ;Diel, I. ;Kunz, C. ;Di Fonzo, S. ;Müller, B. R. ;Jark, W.


Book ID
115346352
Publisher
The Optical Society
Year
1997
Tongue
English
Weight
248 KB
Volume
36
Category
Article
ISSN
1559-128X

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES