๐”– Bobbio Scriptorium
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Characterization of multicomponent polymer trilayers with resonant soft X-ray reflectivity

โœ Scribed by H. Ade; C. Wang; A. Garcia; H. Yan; K. E. Sohn; A. Hexemer; G. C. Bazan; T.-Q. Nguyen; E. J. Kramer

Book ID
105339147
Publisher
John Wiley and Sons
Year
2009
Tongue
English
Weight
770 KB
Volume
47
Category
Article
ISSN
0887-6266

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Experimental techniques used to measure structural parameters of thin films such as thickness, density, and coverage provide important insights into the physical properties of these films. Structural parameters are also often used to predict the eventual performance of thin films. In this study, we