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Characterization of soft breakdown in thin oxide NMOSFETs based on the analysis of the substrate current

✍ Scribed by Crupi, F.; Iannaccone, G.; Crupi, I.; Degraeve, R.; Groeseneken, G.; Maes, H.E.

Book ID: 114538689
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 86 KB
Volume: 48
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.925235

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