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Characterization of silicon–germanium heterojunction bipolar transistors degradation in silicon–germanium BiCMOS technologies

✍ Scribed by Seung-Yun Lee; Chan Woo Park


Book ID
108269527
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
358 KB
Volume
50
Category
Article
ISSN
0038-1101

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