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Characterization of silica xerogel films by variable-angle spectroscopic ellipsometry and infrared spectroscopy

โœ Scribed by Himcinschi, C; Friedrich, M; Murray, C; Streiter, I; Schulz, S E; Gessner, T; Zahn, D R T

Book ID
111652880
Publisher
Institute of Physics
Year
2001
Tongue
English
Weight
202 KB
Volume
16
Category
Article
ISSN
0268-1242

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