✦ LIBER ✦

Characterization of SiGe/Si heterostructures formed by Ge+ and C+ implantation

✍ Scribed by A. Fukami; K. Shoji; T. Nagano; C. Y. Yang

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of extended defects in

✍ F. Cristiano; A. Nejim; B. de Mauduit; A. Claverie; P.L.F. Hemment 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 501 KB

Characterization of GeSi layers formed b

✍ W.Y. Cheung; S.P. Wong; I.H. Wilson; T.H. Zhang 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 283 KB

Oxygen segregation and Ge diffusion in a

✍ Zhenghua An; Miao Zhang; Ricky K. Y. Fu; Paul K. Chu; Chenglu Lin 📂 Article 📅 2004 🏛 Springer US 🌐 English ⚖ 401 KB

Characterization of SiGexSi1 − x heteroj

✍ S. Lombardo; V. Raineri; R. Portoghese; S.U. Campisano; A. Pinto; G. La Rosa; P. 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 386 KB

Visible photoluminescence of nanometer-s

✍ Wen-ting Xu; Hai-ling Tu; Da-li Liu; Ran Teng; Qing-hua Xiao; Qing Chang 📂 Article 📅 2011 🏛 Springer Netherlands 🌐 English ⚖ 271 KB

Epitaxial growth of Si:C/Si/SiGe into ca

✍ Yuji Yamamoto; Klaus Köpke; Günter Weidner; Bernd Tillack 📂 Article 📅 2009 🏛 Elsevier Science 🌐 English ⚖ 794 KB