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Characterization of Si nanowaveguide line edge roughness and its effect on light transmission

โœ Scribed by O. Fursenko; J. Bauer; A. Knopf; S. Marschmeyer; L. Zimmermann; G. Winzer


Book ID
113810202
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
644 KB
Volume
177
Category
Article
ISSN
0921-5107

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